Development of a Magnetic Field Probe for Near-Field Measurement

Current electronic circuits are characterised by their compact design of miniaturisation; however, such a feature has also contributed to the rise electromagnetic compatibility issues. This study introduces technique develop magnetic field probe for near-field measurement. The aims at performing debugging interference on an integrated circuit. Certain processes, as designing microstrip line in simulation and prototype validation well developing functional scanning calibration measurement determine factor, have been performed under frequency domain. model is built both real prototype, handcrafted loop developed with same diameter commercial probe. Calibration set-up vector network analyser (VNA) capture radiated plane. performance terms measuring configuration H-field source scattering region conducted. Two types measurements which S11 S21 will be conducted using VNA. comparison results against plotted MATLAB. represents return loss while power received relative input line. parameter indicate that customised board similar waveform pattern matches one model. revealed it can only function up 2.644 GHz, abnormal result obtained after mentioned. Some factors may affected results, material loss, fabrication tolerance interferences from other devices. Therefore, less reflected radiation environment, designated substrate should perfect correlated